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Barrier inhomogeneities limited current and 1/f noise transport in GaN based nanoscale Schottky barrier diodes

机译:阻挡不均匀性限制了基于GaN的纳米级肖特基势垒二极管中的电流和1 / f噪声传输

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摘要

The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN nanorods and array of nanorods is investigated. The Schottky diodes on individual nanorod show highest barrier height in comparison with large area diodes on nanorods array and epitaxial film which is in contrast with previously published work. The discrepancy between the electrical behaviour of nanoscale Schottky diodes and large area diodes is explained using cathodoluminescence measurements, surface potential analysis using Kelvin probe force microscopy and 1ow frequency noise measurements. The noise measurements on large area diodes on nanorods array and epitaxial film suggest the presence of barrier inhomogeneities at the metal/semiconductor interface which deviate the noise spectra from Lorentzian to 1/f type. These barrier inhomogeneities in large area diodes resulted in reduced barrier height whereas due to the limited role of barrier inhomogeneities in individual nanorod based Schottky diode, a higher barrier height is obtained.
机译:研究了在垂直站立的单个GaN纳米棒和纳米棒阵列上实现的肖特基势垒二极管的电学行为。与先前发表的工作相反,纳米棒阵列和外延膜上的大面积二极管相比,单个纳米棒上的肖特基二极管显示出最高的势垒高度。纳米肖特基二极管和大面积二极管的电学行为之间的差异通过阴极发光测量,使用开尔文探针力显微镜的表面电势分析和低频噪声测量进行了解释。在纳米棒阵列和外延膜上的大面积二极管上的噪声测量表明,金属/半导体界面处存在势垒不均匀性,这将噪声谱从洛伦兹型偏移到1 / f型。大面积二极管中的这些势垒不均匀性导致势垒高度降低,而由于势垒不均匀性在单个基于纳米棒的肖特基二极管中的作用有限,因此可以获得更高的势垒高度。

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